抄録
The spatial resolution of x-ray shearing interferometers increases with the use of x-ray prisms as there are no angular windows. The differential phase of the samples was recorded on the imaging detector by placing the samples in the two beams and the x-ray imaging detector closely to the sample. The phase retrieval of weakly absorbing samples was demonstrated using the fringe scanning method.
| 本文言語 | English |
|---|---|
| ページ（範囲） | 2283-2285 |
| ページ数 | 3 |
| ジャーナル | Journal of Applied Physics |
| 巻 | 93 |
| 号 | 4 |
| DOI | |
| 出版ステータス | Published - 2003 2月 15 |
| 外部発表 | はい |
ASJC Scopus subject areas
- 物理学および天文学（全般）