TY - JOUR
T1 - Serial magnetic tunnel junction based sensors for detecting far-side pits in metallic specimens
AU - Jin, Zhenhu
AU - Ihsan, Muhamad Arif
AU - Oogane, Mikihiko
AU - Fujiwara, Kousuke
AU - Ando, Yasuo
N1 - Publisher Copyright:
© 2019 The Japan Society of Applied Physics.
PY - 2019
Y1 - 2019
N2 - The high sensitivity of magnetic tunnel junctions (MTJs) is independent of the field frequency, and sensors based on them have shown considerable potential in measuring secondary fields during eddy current nondestructive testing (ECT). In this study, sensors with 4, 16, 28, 40, and 52 serial MTJs were fabricated and characterized for detecting variations in magnetic fields. These micrometer-sized TMR sensors with serial MTJs exhibited low detectivities (2.0 ∼ 5.1 nT/Hz0.5 at 100 Hz). Furthermore, in ECT measurements, the sensors were used to detect far-side pits in a copper specimen, and the sensor with 28 serial MTJs offered the highest signal-to-noise ratios when detecting far-side pits with various diameters (2.5, 5.0, and 7.5 mm). In addition, the TMR sensors could detect millimeter-sized far-side pits having various depths and diameters, suggesting that they could detect buried defects in ECT.
AB - The high sensitivity of magnetic tunnel junctions (MTJs) is independent of the field frequency, and sensors based on them have shown considerable potential in measuring secondary fields during eddy current nondestructive testing (ECT). In this study, sensors with 4, 16, 28, 40, and 52 serial MTJs were fabricated and characterized for detecting variations in magnetic fields. These micrometer-sized TMR sensors with serial MTJs exhibited low detectivities (2.0 ∼ 5.1 nT/Hz0.5 at 100 Hz). Furthermore, in ECT measurements, the sensors were used to detect far-side pits in a copper specimen, and the sensor with 28 serial MTJs offered the highest signal-to-noise ratios when detecting far-side pits with various diameters (2.5, 5.0, and 7.5 mm). In addition, the TMR sensors could detect millimeter-sized far-side pits having various depths and diameters, suggesting that they could detect buried defects in ECT.
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U2 - 10.7567/1347-4065/aafe71
DO - 10.7567/1347-4065/aafe71
M3 - Article
AN - SCOPUS:85065183825
VL - 58
JO - Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes
JF - Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes
SN - 0021-4922
IS - 4
M1 - 043003
ER -