Scanning tunnelling microscopy (STM) combined with synchrotron radiation (SR) has been developed. By means of detecting the photoelectrons excited by the SR light with an STM tip, X-ray absorption spectrum (XAS) of the sample surface was successfully obtained during the STM observation. The results suggest the possibilities of the element specific surface analysis by an STM with a microscopic spatial resolution. Several trials for estimating and improving the spatial resolution of the XAS measurement are now undergoing.
|ジャーナル||Journal of Electron Spectroscopy and Related Phenomena|
|出版ステータス||Published - 2005 6|
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