Scanning tunnelling microscope combined with synchrotron radiation for element specific analysis

Taichi Okuda, Toyoaki Eguchi, Takeshi Matsushima, Masayuki Hamada, Xiao Dong Ma, Akira Kataoka, Ayumi Harasawa, Toyohiko Kinoshita, Yukio Hasewgawa

研究成果: Article査読

7 被引用数 (Scopus)

抄録

Scanning tunnelling microscopy (STM) combined with synchrotron radiation (SR) has been developed. By means of detecting the photoelectrons excited by the SR light with an STM tip, X-ray absorption spectrum (XAS) of the sample surface was successfully obtained during the STM observation. The results suggest the possibilities of the element specific surface analysis by an STM with a microscopic spatial resolution. Several trials for estimating and improving the spatial resolution of the XAS measurement are now undergoing.

本文言語English
ページ(範囲)1157-1161
ページ数5
ジャーナルJournal of Electron Spectroscopy and Related Phenomena
144-147
DOI
出版ステータスPublished - 2005 6
外部発表はい

ASJC Scopus subject areas

  • 電子材料、光学材料、および磁性材料
  • 放射線
  • 原子分子物理学および光学
  • 凝縮系物理学
  • 分光学
  • 物理化学および理論化学

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