Scanning tunneling microscope tip current excited by modulated X-rays

Kouichi Tsuji, Toshihiko Nagamura, Kazuaki Wagatsuma

研究成果: Article査読

1 被引用数 (Scopus)

抄録

We measured the current passing between a sample and a scanning tunneling microscope (STM) tip under conditions of X-ray irradiation. As shown in our previous reports, this STM tip current originated from electron emission on the sample surface. For high precision STM tip current measurement, we applied an X-ray modulation technique using an X-ray chopper and a lock-in amplifier. X-rays modulated by the X-ray chopper irradiated the sample surface of the STM, and the STM tip current was detected using the lock-in amplifier. The largest and most stable output from the lock-in amplifier was obtained under the experimental conditions of low modulation frequency (∼10 Hz), strong X-ray intensity, and high STM bias voltage. Compared with measuring the STM tip current directly without the modulation technique, the precision of this measurement is threefold better.

本文言語English
ページ(範囲)2028-2032
ページ数5
ジャーナルJapanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
37
4 SUPPL. A
DOI
出版ステータスPublished - 1998 4

ASJC Scopus subject areas

  • Engineering(all)
  • Physics and Astronomy(all)

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