Scanning tunneling microscope light emission spectroscopy with good signal-to-noise ratio

Yoichi Uehara, Sukekatsu Ushioda

研究成果: Review article査読

抄録

Scanning tunneling microscope (STM) light emission spectroscopy provides a powerful tool for characterization of individual nanometer scale structures on solid surfaces. However, the light to be detected is usually very weak. It is desirable to improve the intensity level for measurements with good signal-to-noise ratio. For this purpose the role that the STM tip-sample gap plays in the light emission is analyzed by the dielectric theory of STM light emission. Based on the theoretical predictions, we discuss how one can obtain strong STM light emission and problems associated with the enhancement of emission.

本文言語English
ページ(範囲)796-800
ページ数5
ジャーナルShinku/Journal of the Vacuum Society of Japan
51
12
DOI
出版ステータスPublished - 2008

ASJC Scopus subject areas

  • 凝縮系物理学
  • 表面、皮膜および薄膜
  • 電子工学および電気工学

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