抄録
A very high-resolution scanning nonlinear dielectric microscope was developed for the observation of ferroelectric polarization. We demonstrate that the resolution of the microscope is of a nanometer order by measurement of the c-c domain wall of a BaTiO3 single crystal, and that this microscope is very useful not only for the domain observation of ferroelectric bulk material but also for that of thin films.
| 本文言語 | English |
|---|---|
| ページ（範囲） | 2833-2835 |
| ページ数 | 3 |
| ジャーナル | Applied Physics Letters |
| 巻 | 75 |
| 号 | 18 |
| DOI | |
| 出版ステータス | Published - 1999 11月 1 |
ASJC Scopus subject areas
- 物理学および天文学（その他）