Scanning anomalous small-angle scattering as a tool to examine welded bulk glass

I. Murase, R. Kurosaki, H. Okuda, S. Ochiai, Y. Yokoyama, A. Inoue, K. Inoue

研究成果: Conference article査読

3 被引用数 (Scopus)


Small-angle scattering measurements utilizing anomalous dispersion effect just below the Zr and Ni K edge have been made for welded Zr-based amorphous materials. The measurements were carried out at a bending magnet beam-line 40B of SPring8. A small and parallel X-ray beam generated at the third generation synchrotron is suitable for nanostructure mapping of heterogeneous materials, whose structure varies with less than a millimeter scale. The remelted and heat-affected zones were examined for electron-beam welded Zr-Ni-Cu-Al alloys. Merits and the characteristics, as well as its present limitations of scanning small-angle scattering with a use of anomalous dispersion effect is discussed as a tool to examine microstructure in the spatially inhomogeneous materials in macroscopic scale as well as microscopic scale.

ジャーナルMaterials Science Forum
出版ステータスPublished - 2005
イベントPRICM 5: The Fifth Pacific Rim International Conference on Advanced Materials and Processing - Beijing, China
継続期間: 2004 11月 22004 11月 5

ASJC Scopus subject areas

  • 材料科学(全般)
  • 凝縮系物理学
  • 材料力学
  • 機械工学


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