Revisit to diffraction anomalous fine structure

T. Kawaguchi, K. Fukuda, K. Tokuda, K. Shimada, T. Ichitsubo, M. Oishi, J. Mizuki, E. Matsubara

研究成果: Article査読

12 被引用数 (Scopus)

抄録

The diffraction anomalous fine structure (DAFS) method that is a spectroscopic analysis combined with resonant X-ray diffraction enables the determination of the valence state and local structure of a selected element at a specific crystalline site and/or phase. This method has been improved by using a polycrystalline sample, channel-cut monochromator optics with an undulator synchrotron radiation source, an area detector and direct determination of resonant terms with a logarithmic dispersion relation. This study makes the DAFS method more convenient and saves a large amount of measurement time in comparison with the conventional DAFS method with a single crystal. The improved DAFS method has been applied to some model samples, Ni foil and Fe3O4 powder, to demonstrate the validity of the measurement and the analysis of the present DAFS method.

本文言語English
ページ(範囲)1247-1251
ページ数5
ジャーナルJournal of Synchrotron Radiation
21
6
DOI
出版ステータスPublished - 2014 11月 1
外部発表はい

ASJC Scopus subject areas

  • 放射線
  • 核物理学および高エネルギー物理学
  • 器械工学

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