Reversible electrical modification on conductive polymer for proximity probe data storage

研究成果: Article査読

16 被引用数 (Scopus)

抄録

Reversible electrical modification of a conductive polymer is studied for ultrahigh density data storage based on a scanning probe microscope (SPM). Using a surface-initiated polymerization (SIP) method, a thin polyaniline film is formed from a self-assembled monolayer (SAM) on an Au surface. The conductivity of the film is reversibly changed by applying a voltage between a SPM probe and the film, depending on the polarity of the applied voltage. This reversible electrical modification is considered to originate in the oxidation-reduction reaction or protonation-deprotonation reaction of PANI from x-ray photoelectron spectroscopy (XPS) measurement.

本文言語English
ページ(範囲)2516-2520
ページ数5
ジャーナルNanotechnology
16
11
DOI
出版ステータスPublished - 2005 11 1

ASJC Scopus subject areas

  • バイオエンジニアリング
  • 化学 (全般)
  • 材料科学(全般)
  • 材料力学
  • 機械工学
  • 電子工学および電気工学

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