Resonant X-ray scattering study of hidden order in URu2Si 2 using a low-stress single crystal

H. Amitsuka, T. Inami, M. Yokoyama, S. Takayama, Y. Ikeda, I. Kawasaki, Y. Homma, H. Hidaka, T. Yanagisawa

研究成果: Conference article査読

25 被引用数 (Scopus)

抄録

We have studied a puzzling phase below 17.5 K of URu2Si 2 by means of resonant X-ray scattering (RXS) near the U M IV absorption edge (E ∼ 3.73 keV), using a high-quality single-crystalline sample with low residual stress. We reconfirm that a commensurate (003) superlattice reflection comes purely from antiferromegnetic dipolar order with ordering wave vector QAF = (1, 0, 0). No other traces of significant RXS have been detected in a major region of (h0l) plane, indicating absence of quadrupolar order within a searched Q range including a conceivable nesting vector Q* = (1.4, 0, 0).

本文言語English
論文番号012007
ジャーナルJournal of Physics: Conference Series
200
SECTION 1
DOI
出版ステータスPublished - 2010

ASJC Scopus subject areas

  • Physics and Astronomy(all)

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