Resolution enhancement of confocal microscopy by subtraction method with vector beams

Susumu Segawa, Yuichi Kozawa, Shunichi Sato

研究成果: Article査読

55 被引用数 (Scopus)

抄録

We proposed a subtraction method using vector beams for resolution enhancement in confocal microscopy. The imaging simulation revealed that the negative side lobe due to the excess subtraction resulted in the degradation of the object image. The subtraction imaging using vector beams demonstrated high spatial resolution with avoiding the negative side lobe. Further resolution enhancement beyond 100 nm was predicted by using a flat-top beam obtained by the combination of beams with radial and azimuthal polarizations and a higher-order transverse mode azimuthally polarized beam without significant negative side lobe.

本文言語English
ページ(範囲)3118-3121
ページ数4
ジャーナルOptics Letters
39
11
DOI
出版ステータスPublished - 2014 6 1

ASJC Scopus subject areas

  • 原子分子物理学および光学

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