抄録
An optical intensity correlation measurement is carried out on the recovery of saturable absorber (SA) in an modelocked semiconductor laser diode (MLLD) device in picosecond temporal regions. Optical pulse train of few picosecond with repetition rates of up to 10 GHz is used to provide direct information on the SA response to high-repetition optical pulses as occurs in actual modelocking operation. The shortest recovery time observed was 8 ps at a reverse bias of 2 V. Short recovery times at a large reverse bias are consistently observed over a wide range of pulse repetition rates and optical pump energies. The results showed that the fast SA recovery in the picosecond range takes place in actual modelocking operation.
| 本文言語 | English |
|---|---|
| ページ数 | 1 |
| ジャーナル | Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS |
| 巻 | 11 |
| 出版ステータス | Published - 1997 1月 1 |
| 外部発表 | はい |
| イベント | Proceedings of the 1997 Conference on Lasers and Electro-Optics, CLEO - Baltimore, MD, USA 継続期間: 1997 5月 18 → 1997 5月 23 |
ASJC Scopus subject areas
- 電子材料、光学材料、および磁性材料
- 電子工学および電気工学