We present the recent progress of the FZP (Fresnel Zone Plate) beam profile monitor constructed at KEK-ATF damping ring. This monitor is based on an X-ray imaging optics with two FZPs . In this monitor, the transverse electron beam image at bending magnet is twenty-times magnified by the two FZPs and detected on an X-ray CCD camera. The expected spatial resolution is less than 1 m. Recently, we install the new mechanical shutter in order to avoid the unexpected 100Hz vibration. By applying this shutter, the shutter opening time was reduced less than 1ms and the 100Hz vibration could be neglected on the beam profile measurement. In this paper, we report the new shutter performance and the measurement results of beam profile by the improved FZP beam profile monitor.
|出版ステータス||Published - 2020|
|イベント||36th ICFA Advanced Beam Dynamics Workshop on Nano Scale Beams, NANOBEAM 2005 - Kyoto, Japan|
継続期間: 2005 10 17 → 2005 10 21
|Conference||36th ICFA Advanced Beam Dynamics Workshop on Nano Scale Beams, NANOBEAM 2005|
|Period||05/10/17 → 05/10/21|
ASJC Scopus subject areas