Recent Status of Fresnel Zone Plate monitor at KEK-ATF damping ring

Hiroshi Sakai, Norio Nakamura, Hitoshi Hayano, Toshiya Muto

研究成果: Paper査読

抄録

We present the recent progress of the FZP (Fresnel Zone Plate) beam profile monitor constructed at KEK-ATF damping ring. This monitor is based on an X-ray imaging optics with two FZPs [1]. In this monitor, the transverse electron beam image at bending magnet is twenty-times magnified by the two FZPs and detected on an X-ray CCD camera. The expected spatial resolution is less than 1 m. Recently, we install the new mechanical shutter in order to avoid the unexpected 100Hz vibration. By applying this shutter, the shutter opening time was reduced less than 1ms and the 100Hz vibration could be neglected on the beam profile measurement. In this paper, we report the new shutter performance and the measurement results of beam profile by the improved FZP beam profile monitor.

本文言語English
ページ404-406
ページ数3
出版ステータスPublished - 2020
外部発表はい
イベント36th ICFA Advanced Beam Dynamics Workshop on Nano Scale Beams, NANOBEAM 2005 - Kyoto, Japan
継続期間: 2005 10 172005 10 21

Conference

Conference36th ICFA Advanced Beam Dynamics Workshop on Nano Scale Beams, NANOBEAM 2005
国/地域Japan
CityKyoto
Period05/10/1705/10/21

ASJC Scopus subject areas

  • 核物理学および高エネルギー物理学
  • 原子分子物理学および光学

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