Recent progress in four-dimensional phase tomography with grating interferometry

Atsushi Momose, Sébastien Harasse, Shunsuke Kibayashi, Margie P. Olbinado, Wataru Yashiro

研究成果: Conference contribution

1 被引用数 (Scopus)

抄録

Four-dimensional X-ray phase tomography has been implemented by a combination of X-ray Talbot interferometry and white synchrotron radiation. While the Fourier-transform method has been used for the measurement of a differential phase image at every projection direction, an improved scan mode based on the fringe-scanning method is demonstrated to improve spatial resolution. The disadvantage of the fringe-scanning method, which requires multiple moiré images, is overcome by proposing a scan mode synchronously combining one-way continuous movements of sample rotation and grating displacement. In addition, the operation of an X-ray Talbot-Lau interferometer with white synchrotron radiation is reported. While an X-ray Talbot interferometer requires a horizontal sample rotation axis because of the condition of spatial coherency, such a horizontal rotation axis is not preferable for tomographic scans especially for soft objects. An X-ray Talbot-Lau interferometer overcomes this problem, allowing a vertical sample rotation axis. Although we encountered a vibration problem with the X-ray Talbot-Lau interferometer probably because of incomplete stage stability, our attempts have basically been successful, and we expect that various samples can be scanned by four-dimensional X-ray phase tomography, revealing dynamical properties in weakly absorbing objects that cannot be accessed by conventional X-ray phase tomography mainly performed for static samples.

本文言語English
ホスト出版物のタイトルDevelopments in X-Ray Tomography VIII
DOI
出版ステータスPublished - 2012 12 1
イベントDevelopments in X-Ray Tomography VIII - San Diego, CA, United States
継続期間: 2012 8 132012 8 15

出版物シリーズ

名前Proceedings of SPIE - The International Society for Optical Engineering
8506
ISSN(印刷版)0277-786X

Other

OtherDevelopments in X-Ray Tomography VIII
国/地域United States
CitySan Diego, CA
Period12/8/1312/8/15

ASJC Scopus subject areas

  • 電子材料、光学材料、および磁性材料
  • 凝縮系物理学
  • コンピュータ サイエンスの応用
  • 応用数学
  • 電子工学および電気工学

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