抄録
X-ray uorescence holography (XFH) provides three dimensional atomic images around specied elements. The XFH uses atoms as a wave source or monitor of interference eld within a crystal sample, and therefore it can record both intensity and phase of scattered X-rays. In this article, I show the theory including solutions for twin image problem, advanced measuring system, applications to dopants in silicon steel and shape-memory alloy related material, a new holographic method with X-ray excited optical luminescence.
| 本文言語 | English |
|---|---|
| ページ（範囲） | 363-370 |
| ページ数 | 8 |
| ジャーナル | e-Journal of Surface Science and Nanotechnology |
| 巻 | 9 |
| DOI | |
| 出版ステータス | Published - 2011 10 1 |
ASJC Scopus subject areas
- バイオテクノロジー
- バイオエンジニアリング
- 凝縮系物理学
- 材料力学
- 表面および界面
- 表面、皮膜および薄膜