抄録
X-ray uorescence holography (XFH) provides three dimensional atomic images around specied elements. The XFH uses atoms as a wave source or monitor of interference eld within a crystal sample, and therefore it can record both intensity and phase of scattered X-rays. In this article, I show the theory including solutions for twin image problem, advanced measuring system, applications to dopants in silicon steel and shape-memory alloy related material, a new holographic method with X-ray excited optical luminescence.
本文言語 | English |
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ページ(範囲) | 363-370 |
ページ数 | 8 |
ジャーナル | e-Journal of Surface Science and Nanotechnology |
巻 | 9 |
DOI | |
出版ステータス | Published - 2011 10 1 |
ASJC Scopus subject areas
- Biotechnology
- Bioengineering
- Condensed Matter Physics
- Mechanics of Materials
- Surfaces and Interfaces
- Surfaces, Coatings and Films