Ray-tracing analysis of fresnel-zone-plate optical system as an electron beam profile monitor

Masami Fujisawa, Hiroshi Sakai, Norio Nakamura, Hitoshi Hayano, Toshiya Muto

研究成果: Conference contribution

1 被引用数 (Scopus)

抄録

The analysis of the image distortion made by Fresnel-zone-plate optical system was studied with ray trace simulation and analytical treatment. The tolerable tilt angle depends on the tolerable image size. The distortion appears not only in image size but in image inclination. The simulation and the analysis performed for the optical parameters of the electron beam profile monitor may be useful for the advancement of the X-ray microscope performance.

本文言語English
ホスト出版物のタイトルSYNCHROTRON RADIATION INSTRUMENTATION
ホスト出版物のサブタイトルNinth International Conference on Synchrotron Radiation Instrumentation
ページ1117-1120
ページ数4
DOI
出版ステータスPublished - 2007 3 26
外部発表はい
イベントSYNCHROTRON RADIATION INSTRUMENTATION: 9th International Conference on Synchrotron Radiation Instrumentation - Daegu, Korea, Republic of
継続期間: 2006 5 282006 6 28

出版物シリーズ

名前AIP Conference Proceedings
879
ISSN(印刷版)0094-243X
ISSN(電子版)1551-7616

Other

OtherSYNCHROTRON RADIATION INSTRUMENTATION: 9th International Conference on Synchrotron Radiation Instrumentation
CountryKorea, Republic of
CityDaegu
Period06/5/2806/6/28

ASJC Scopus subject areas

  • Physics and Astronomy(all)

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