Random imperfection (I)

Kiyohiro Ikeda, Kazuo Murota

研究成果: Chapter

抄録

The critical load of a structure is subject to a probabilistic scatter when it is modeled as a function of several random imperfections. This chapter offers a procedure to obtain the probability density function of the critical load for structures with a number of imperfections with known probabilistic characteristics. Chapter 3, “Imperfection Sensitivity Laws,” is a foundation of this chapter, and this chapter is extended to a system with group symmetry in Chap. 11.

本文言語English
ホスト出版物のタイトルApplied Mathematical Sciences (Switzerland)
出版社Springer
ページ121-140
ページ数20
DOI
出版ステータスPublished - 2019 1 1

出版物シリーズ

名前Applied Mathematical Sciences (Switzerland)
149
ISSN(印刷版)0066-5452
ISSN(電子版)2196-968X

ASJC Scopus subject areas

  • 応用数学

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