TY - JOUR
T1 - Raman spectroscopic fingerprint of ferroelectric SrBi2Ta2O9 thin films
T2 - A rapid distinction method for fluorite and pyrochlore phases
AU - Osada, Minoru
AU - Kakihana, Masato
AU - Mitsuya, Masatoshi
AU - Watanabe, Takayuki
AU - Funakubo, Hiroshi
PY - 2001/8/15
Y1 - 2001/8/15
N2 - We present the use of Raman spectroscopy as a rapid and sensitive means for the phase characterization of ferroelectric SrBi2(Ta1-xNbx)2O9 (SBTN) thin films. It is shown that frequency shifts, together with Raman selection rules, are characteristic of layered perovskite, fluorite and pyrochlore structures, and thus the Raman spectra can be used as a fingerprint of the symmetry of the examined film. We also find the enormous potential of Raman spectroscopy to detect and quantify fractions of the fluorite and pyrochlore phases coexistent with the SBTN phase.
AB - We present the use of Raman spectroscopy as a rapid and sensitive means for the phase characterization of ferroelectric SrBi2(Ta1-xNbx)2O9 (SBTN) thin films. It is shown that frequency shifts, together with Raman selection rules, are characteristic of layered perovskite, fluorite and pyrochlore structures, and thus the Raman spectra can be used as a fingerprint of the symmetry of the examined film. We also find the enormous potential of Raman spectroscopy to detect and quantify fractions of the fluorite and pyrochlore phases coexistent with the SBTN phase.
KW - Fluorite
KW - Impurity phase
KW - Phase identification
KW - Pyrochlore
KW - Raman scattering
KW - SrBi(TaNb)O (SBTN)
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U2 - 10.1143/jjap.40.l891
DO - 10.1143/jjap.40.l891
M3 - Article
AN - SCOPUS:0035880365
VL - 40
SP - L891-L893
JO - Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes
JF - Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes
SN - 0021-4922
IS - 8 B
ER -