Raman spectroscopic fingerprint of ferroelectric SrBi2Ta2O9 thin films: A rapid distinction method for fluorite and pyrochlore phases

Minoru Osada, Masato Kakihana, Masatoshi Mitsuya, Takayuki Watanabe, Hiroshi Funakubo

研究成果: Article査読

13 被引用数 (Scopus)

抄録

We present the use of Raman spectroscopy as a rapid and sensitive means for the phase characterization of ferroelectric SrBi2(Ta1-xNbx)2O9 (SBTN) thin films. It is shown that frequency shifts, together with Raman selection rules, are characteristic of layered perovskite, fluorite and pyrochlore structures, and thus the Raman spectra can be used as a fingerprint of the symmetry of the examined film. We also find the enormous potential of Raman spectroscopy to detect and quantify fractions of the fluorite and pyrochlore phases coexistent with the SBTN phase.

本文言語English
ページ(範囲)L891-L893
ジャーナルJapanese Journal of Applied Physics, Part 2: Letters
40
8 B
出版ステータスPublished - 2001 8 15
外部発表はい

ASJC Scopus subject areas

  • 工学(全般)
  • 物理学および天文学(その他)
  • 物理学および天文学(全般)

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「Raman spectroscopic fingerprint of ferroelectric SrBi<sub>2</sub>Ta<sub>2</sub>O<sub>9</sub> thin films: A rapid distinction method for fluorite and pyrochlore phases」の研究トピックを掘り下げます。これらがまとまってユニークなフィンガープリントを構成します。

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