PTRF X-ray absorption fine structure as a new technique for catalyst characterization

W. J. Chun, M. Shirai, K. Tomishige, K. Asakura, Y. Iwasawa

研究成果: Article査読

4 被引用数 (Scopus)

抄録

A chamber for observation in situ of polarized total-reflection fluorescence extended X-ray absorption fine structure (PTRF-XAFS) spectra was constructed, which makes it possible to measure the PTRF-XAFS spectra in situ under preparation, treatment, and reaction conditions from high vacuum( 1×10-9 Pa) to high pressure( 1×105Pa) and from low temperature(100 K) to high temperature(800 K). The PTRF-XAFS technique can provide information on asymmetric or anisotropic structure of active metal and metal-oxide sites supported on single crystal substrates as models for supported catalysts, by measuring bondings of supported species in two or three different directions parallel and perpendicular to the surface independently. Typical EXAFS and XANES spectra for Cu2+/α-SiO2 (0001), CoOx/α-Al2O3 (0001), [Pt]4/α-Al2O3 (0001), and V2O5/ZrO2 (100) taken by the PTRF-XAFS chamber are discussed in relation to their catalytic properties.

本文言語English
ページ(範囲)55-65
ページ数11
ジャーナルJournal of Molecular Catalysis A: Chemical
107
1-3
DOI
出版ステータスPublished - 1996 1月 1
外部発表はい

ASJC Scopus subject areas

  • 触媒
  • プロセス化学およびプロセス工学
  • 物理化学および理論化学

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