PT L3 near edge structure of halogen-bridged mixed-valence pt complexes and pd-pt mixed-metal complexes

H. Tanino, H. Oyanagi, M. Yamashita, K. Kobayashi

研究成果: Article査読

15 被引用数 (Scopus)

抄録

X-ray absorption near edge structure (XANES) of halogen-bridged mixed-valence Pt complexes and halogen-bridged Pd-Pt mixed-metal complexes have been measured using synchrotron radiation with a high energy resolution. In Pd-Pt mixed metal complexes, we demonstrate that the degree of the valence is estimated from the intensity of the white line at the Pt L3 edge. In the mixed-valence complexes, the electron system is proved to be the Peierls insulator with a charge density wave of renormalized d electrons of Pt, where the total valence of PtIV- and Pt11 is conserved without excess electrons from ligands or anions.

本文言語English
ページ(範囲)953-956
ページ数4
ジャーナルSolid State Communications
53
11
DOI
出版ステータスPublished - 1985 3月
外部発表はい

ASJC Scopus subject areas

  • 化学 (全般)
  • 凝縮系物理学
  • 材料化学

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