Preparation and characterization of ultraflat Pt facets by atom-height-resolved differential optical microscopy

M. Azhagurajan, R. Wen, Y. G. Kim, T. Itoh, K. Sashikata, K. Itaya

研究成果: Article査読

6 被引用数 (Scopus)

抄録

We recently demonstrated that improvements to our technique, laser confocal microscopy with differential interference microscopy (LCM-DIM), has rendered it fully capable of resolving monatomic steps with heights of ca. 0.25 nm on Au(111) and Pd(111) surfaces, even as low as 0.14 nm on Si(100), in aqueous solution. In this paper, we describe in detail a method to prepare and characterize, via atomic-layer-resolved LCM-DIM, ultraflat Pt(111) and Pt(100) facets over a wide surface area. The preparation of ultraflat surfaces is important in the characterization at the atomic scale of electrochemical processes under reaction conditions. To showcase the elegance of LCM-DIM, the anodic dissolution of Pt in aqueous HCl is briefly recounted.

本文言語English
ページ(範囲)57-62
ページ数6
ジャーナルSurface Science
631
DOI
出版ステータスPublished - 2015 1月

ASJC Scopus subject areas

  • 凝縮系物理学
  • 表面および界面
  • 表面、皮膜および薄膜
  • 材料化学

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