In conventional total reflection x-ray fluorescence (TXRF), one glancing x-ray beam irradiates the sample carrier for excitation of x-ray fluorescence. However, it is also possible to excite x-ray fluorescence by multiple x-ray beams. We performed a preliminary TXRF experiment excited by two independent glancing x-ray beams. The two x-ray beams excitation would be effective to enhance the intensity of x-ray fluorescence and to improve the detection limit in TXRF. X rays from both a rotating Mo anode x-ray tube and a glow discharge x-ray tube with an Fe target irradiated a Cr thin film sample on a quartz glass. The x-ray fluorescence of Cr Ka from the sample was slightly enhanced compared with the intensity measured by one x-ray beam excitation.
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