抄録

This paper presents a new intentional electromagnetic interference (IEMI) fault injection method that can be used to inject transient faults into cryptographic operations with precise timing from a distance. Such IEMI fault injection can be used for performing fault analysis attacks, such as differential fault analysis and fault sensitivity analysis, and therefore it could pose a severe threat to various cryptographic devices for which it is assumed that attackers cannot acquire direct access. In the proposed IEMI fault injection method, a block (i.e., a period) of sinusoidal waves is injected via cables attached to a cryptographic device, instead of using electromagnetic pulses as in conventional methods. The injected EM waves have a temporary impact on the cryptographic module but not on other components of the device. In addition, the proposed method employs EM information leaked from the cryptographic module as the trigger signal for fault injection. In this paper, we demonstrate experimentally that the proposed method can be used to inject precisely timed faults into the final round of an AES operation.

本文言語English
ホスト出版物のタイトル2014 IEEE International Symposium on Electromagnetic Compatibility, EMC 2014
出版社Institute of Electrical and Electronics Engineers Inc.
ページ738-742
ページ数5
September
ISBN(電子版)9781479955442
DOI
出版ステータスPublished - 2014 9 15
イベント2014 IEEE International Symposium on Electromagnetic Compatibility, EMC 2014 - Raleigh, United States
継続期間: 2014 8 32014 8 8

出版物シリーズ

名前IEEE International Symposium on Electromagnetic Compatibility
番号September
2014-September
ISSN(印刷版)1077-4076
ISSN(電子版)2158-1118

Other

Other2014 IEEE International Symposium on Electromagnetic Compatibility, EMC 2014
国/地域United States
CityRaleigh
Period14/8/314/8/8

ASJC Scopus subject areas

  • 凝縮系物理学
  • 電子工学および電気工学

フィンガープリント

「Precisely timed IEMI fault injection synchronized with em information leakage」の研究トピックを掘り下げます。これらがまとまってユニークなフィンガープリントを構成します。

引用スタイル