TY - GEN
T1 - Precisely timed IEMI fault injection synchronized with em information leakage
AU - Hayashi, Yu-Ichi
AU - Homma, Naofumi
AU - Mizuki, Takaaki
AU - Aoki, Takafumi
AU - Sone, Hideaki
N1 - Publisher Copyright:
© 2014 IEEE.
PY - 2014/9/15
Y1 - 2014/9/15
N2 - This paper presents a new intentional electromagnetic interference (IEMI) fault injection method that can be used to inject transient faults into cryptographic operations with precise timing from a distance. Such IEMI fault injection can be used for performing fault analysis attacks, such as differential fault analysis and fault sensitivity analysis, and therefore it could pose a severe threat to various cryptographic devices for which it is assumed that attackers cannot acquire direct access. In the proposed IEMI fault injection method, a block (i.e., a period) of sinusoidal waves is injected via cables attached to a cryptographic device, instead of using electromagnetic pulses as in conventional methods. The injected EM waves have a temporary impact on the cryptographic module but not on other components of the device. In addition, the proposed method employs EM information leaked from the cryptographic module as the trigger signal for fault injection. In this paper, we demonstrate experimentally that the proposed method can be used to inject precisely timed faults into the final round of an AES operation.
AB - This paper presents a new intentional electromagnetic interference (IEMI) fault injection method that can be used to inject transient faults into cryptographic operations with precise timing from a distance. Such IEMI fault injection can be used for performing fault analysis attacks, such as differential fault analysis and fault sensitivity analysis, and therefore it could pose a severe threat to various cryptographic devices for which it is assumed that attackers cannot acquire direct access. In the proposed IEMI fault injection method, a block (i.e., a period) of sinusoidal waves is injected via cables attached to a cryptographic device, instead of using electromagnetic pulses as in conventional methods. The injected EM waves have a temporary impact on the cryptographic module but not on other components of the device. In addition, the proposed method employs EM information leaked from the cryptographic module as the trigger signal for fault injection. In this paper, we demonstrate experimentally that the proposed method can be used to inject precisely timed faults into the final round of an AES operation.
KW - electromagnetic fault injection
KW - Fault sensitivity analysis
KW - intentional electromagnetic interference
UR - http://www.scopus.com/inward/record.url?scp=84931833501&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84931833501&partnerID=8YFLogxK
U2 - 10.1109/ISEMC.2014.6899066
DO - 10.1109/ISEMC.2014.6899066
M3 - Conference contribution
AN - SCOPUS:84931833501
T3 - IEEE International Symposium on Electromagnetic Compatibility
SP - 738
EP - 742
BT - 2014 IEEE International Symposium on Electromagnetic Compatibility, EMC 2014
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2014 IEEE International Symposium on Electromagnetic Compatibility, EMC 2014
Y2 - 3 August 2014 through 8 August 2014
ER -