Precise resistance measurement of quantum anomalous Hall effect in magnetic heterostructure film of topological insulator

Yuma Okazaki, Takehiko Oe, Minoru Kawamura, Ryutaro Yoshimi, Shuji Nakamura, Shintaro Takada, Masataka Mogi, Kei S. Takahashi, Atsushi Tsukazaki, Masashi Kawasaki, Yoshinori Tokura, Nobu Hisa Kaneko

研究成果: Article査読

1 被引用数 (Scopus)

抄録

The accuracy of Hall resistance in the quantum anomalous Hall effect has been studied at zero magnetic field using Crx(Bi,Sb) 2 - x Te3-based magnetic heterostructure films of topological insulators. The measured deviation of the Hall resistance from its theoretical value h / e 2 was less than 2 ppm when the source drain current was 30 nA. This result has verified that the quantization of the Hall resistance is very accurate in the magnetic heterostructure films and in the previously reported uniformly doped films.

本文言語English
論文番号143101
ジャーナルApplied Physics Letters
116
14
DOI
出版ステータスPublished - 2020 4 6

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

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