Power noise measurements of cryptographic VLSI circuits regarding side-channel information leakage
Daisuke Fujimoto, Noriyuki Miura, Makoto Nagata, Yu-Ichi Hayashi, Naofumi Homma, Takafumi Aoki, Yohei Hori, Toshihiro Katashita, Kazuo Sakiyama, Thanh Ha Le, Julien Bringer, Pirouz Bazargan-Sabet, Shivam Bhasin, Jean Luc Danger
研究成果: Article › 査読
2
被引用数
(Scopus)