Polarization measurement of SR from a helical undulator using a quarter-wave plate for a wavelength of 12.8 nm

H. Kimura, T. Miyahara, Y. Goto, K. Mayama, M. Yanagihara, M. Yamamoto

研究成果: Article査読

32 被引用数 (Scopus)

抄録

At a wavelength of 12.8 nm, polarization states of nominally circularly polarized light emitted from a helical undulator and monochromatized by a grating monochromator were measured (KEK-PF BL-28A). With a transmission-type multilayer quarter-wave plate and a multilayer mirror polarization analyzer mounted on a beamline ellipsometer, all polarization parameters of the circularly polarized SR at various conditions were determined. The best degree of circular polarization after the grating monochromator was found to be as high as 0.95.

本文言語English
ページ(範囲)1920-1922
ページ数3
ジャーナルReview of Scientific Instruments
66
2
DOI
出版ステータスPublished - 1995

ASJC Scopus subject areas

  • 器械工学

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