Physical origins of ON-OFF switching in ReRAM via VO based conducting channels

Katsumasa Kamiya, Moon Young Yang, Seong Geon Park, Blanka Magyari-Köpe, Yoshio Nishi, Masaaki Niwa, Kenji Shiraishi

研究成果: Conference contribution

抄録

We study the ON-OFF switching mechanism of ReRAM via oxygen vacancy (V O) based conducting channels using first-principles calculations. We find cohesion-dispersion transition of VO upon carrier injection and removal is a strong driving force in the ON-OFF switching in binary-oxide-based ReRAMs. The physical origins of the transition is the formation of bonding-like hybridized orbitals of VO defect levels, whose occupation can be controlled by changing system Fermi level by applying a voltage.

本文言語English
ホスト出版物のタイトルPhysics of Semiconductors - Proceedings of the 31st International Conference on the Physics of Semiconductors, ICPS 2012
出版社American Institute of Physics Inc.
ページ11-12
ページ数2
ISBN(印刷版)9780735411944
DOI
出版ステータスPublished - 2013 1月 1
外部発表はい
イベント31st International Conference on the Physics of Semiconductors, ICPS 2012 - Zurich, Switzerland
継続期間: 2012 7月 292012 8月 3

出版物シリーズ

名前AIP Conference Proceedings
1566
ISSN(印刷版)0094-243X
ISSN(電子版)1551-7616

Other

Other31st International Conference on the Physics of Semiconductors, ICPS 2012
国/地域Switzerland
CityZurich
Period12/7/2912/8/3

ASJC Scopus subject areas

  • 物理学および天文学(全般)

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