Photoemission (UPS and XPS) study of local structures of amorphous GeTe and GeSe films

Takashi Takahashi, Takasi Sagawa

研究成果: Article査読

5 被引用数 (Scopus)

抄録

In situ photoemission (UPS and XPS) measurements have been performed for amorphous GeTe and GeSe films deposited onto a cooled substrate during thermal annealing and crystallization of the films. It has been found that an amorphous film prepared at room temperature has a 4-2 coordinated local structure while a highly disordered film deposited onto a 77 K substrate is largely 3-3 coordinated and relaxes into the 4-2 coordinated structure upon thermal annealing.

本文言語English
ページ(範囲)879-882
ページ数4
ジャーナルJournal of Non-Crystalline Solids
59-60
PART 2
DOI
出版ステータスPublished - 1983 12

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Ceramics and Composites
  • Condensed Matter Physics
  • Materials Chemistry

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