Photoemission (UPS and XPS) study of crystallization of amorphous GeTe film

T. Takahashi, H. Sakurai, T. Sagawa

研究成果: Article査読

13 被引用数 (Scopus)

抄録

In situ photoemission (UPS and XPS) measurements have been performed for amorphous GeTe films. The photoemission spectra exhibit a drastic change upon thermal annealing and/or the crystallization of the film. It has been found that an amorphous GeTe film deposited onto a room temperature substrate has a 4-2 coordinated local structure, while a highly disordered amorphous GeTe film evaporated onto a cooled (77 K) substrate is largely 3-3 coordinated, and relaxes into the 4-2 coordinated structure upon thermal annealing within amorphous phase.

本文言語English
ページ(範囲)723-726
ページ数4
ジャーナルSolid State Communications
44
5
DOI
出版ステータスPublished - 1982 11

ASJC Scopus subject areas

  • 化学 (全般)
  • 凝縮系物理学
  • 材料化学

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