Photoelectron spectra enhanced by x-ray total reflection and diffraction from periodic multilayer

Kouichi Hayashi, Shin'Ichi Kawato, Toshihisa Horiuchi, Kazumi Matsushige, Yoshinori Kitajima, Hisataka Takenaka, Jun Kawai

研究成果: Article査読

23 被引用数 (Scopus)

抄録

Photoelectron spectra from a periodic multilayer of (Mo/B4C)30/Si were measured by changing the x-ray glancing angle. The angular dependencies of the photoelectron intensities of O1s and Mo3d revealed the atomic depth profiles of the Mo oxide overlayer, and the compositions of the MoO3 upper layer and MoO2 lower layer. Furthermore, we observed enhancement of photoelectron emission by means of x-ray standing waves generated near the multilayer surface during x-ray diffraction from the superlattice.

本文言語English
ページ(範囲)1921-1923
ページ数3
ジャーナルApplied Physics Letters
68
14
DOI
出版ステータスPublished - 1996

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

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