抄録
X-ray interferometry for imaging applications is discussed with a review of X-ray interferometric imaging activities reported to date. Phase measurement and phase tomography based on X-ray interferometry are also presented. Finally the advantage of X-ray interferometric imaging in comparison with other phase-sensitive X-ray imaging methods is discussed.
| 本文言語 | English |
|---|---|
| ページ（範囲） | 2303-2314 |
| ページ数 | 12 |
| ジャーナル | Optics Express |
| 巻 | 11 |
| 号 | 19 |
| DOI | |
| 出版ステータス | Published - 2003 9月 |
| 外部発表 | はい |
ASJC Scopus subject areas
- 原子分子物理学および光学