抄録
X-ray interferometry for imaging applications is discussed with a review of X-ray interferometric imaging activities reported to date. Phase measurement and phase tomography based on X-ray interferometry are also presented. Finally the advantage of X-ray interferometric imaging in comparison with other phase-sensitive X-ray imaging methods is discussed.
本文言語 | English |
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ページ(範囲) | 2303-2314 |
ページ数 | 12 |
ジャーナル | Optics Express |
巻 | 11 |
号 | 19 |
DOI | |
出版ステータス | Published - 2003 9月 |
外部発表 | はい |
ASJC Scopus subject areas
- 原子分子物理学および光学