Phase-operation for conduction electron by atomic-scale scattering via single point-defect

Katsumi Nagaoka, Shin Yaginuma, Tomonobu Nakayama

    研究成果: Article査読

    5 被引用数 (Scopus)

    抄録

    In order to propose a phase-operation technique for conduction electrons in solid, we have investigated, using scanning tunneling microscopy, an atomic-scale electron-scattering phenomenon on a 2D subband state formed in Si. Particularly, we have noticed a single surface point-defect around which a standing-wave pattern created, and a dispersion of scattering phase-shifts by the defect-potential against electron-energy has been measured. The behavior is well-explained with appropriate scattering parameters: the potential height and radius. This result experimentally proves that the atomic-scale potential scattering via the point defect enables phase-operation for conduction electrons.

    本文言語English
    論文番号111602
    ジャーナルApplied Physics Letters
    104
    11
    DOI
    出版ステータスPublished - 2014 3月 17

    ASJC Scopus subject areas

    • 物理学および天文学(その他)

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