Optical scanning probe system for electromagnetic near field measurements

Masanori Takahashi, Katsumi Kawasaki, Hiroyuki Ohba, Tomokazu Ikenaga, Hiroyasu Ota, Tatsuru Orikasa, Nobuyasu Adachi, Kazushi Ishiyama, Ken Ichi Arai

研究成果: Conference contribution

6 被引用数 (Scopus)

抄録

An optical scanning electromagnetic field probe system, consisting of an electro-optic or magneto-optic crystal substrate and a galvano scanner, has been developed for high speed, low-invasive measurement of electromagnetic near field distribution. We demonstrate the measurement of electric field distributions using a LiNbO 3 crystal substrate and the probe system. We also measure magnetic field distributions above a microstrip line in the gigahertz range using a magnetic garnet thin film. The probe system is also used for measuring electromagnetic field distributions above a commercially available IC.

本文言語English
ホスト出版物のタイトル2009 IEEE International Symposium on Electromagnetic Compatibility, EMC 2009
ページ6-11
ページ数6
DOI
出版ステータスPublished - 2009
イベント2009 IEEE International Symposium on Electromagnetic Compatibility, EMC 2009 - Austin, TX, United States
継続期間: 2009 8月 172009 8月 21

出版物シリーズ

名前IEEE International Symposium on Electromagnetic Compatibility
ISSN(印刷版)1077-4076

Other

Other2009 IEEE International Symposium on Electromagnetic Compatibility, EMC 2009
国/地域United States
CityAustin, TX
Period09/8/1709/8/21

ASJC Scopus subject areas

  • 凝縮系物理学
  • 電子工学および電気工学

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