Optical metrology for precision engineering

Wei Gao, Bernd Bodermann

研究成果: Editorial › 査読

本文言語	English
ページ（範囲）	373-374
ページ数	2
ジャーナル	Advanced Optical Technologies
巻	3
号	4
DOI	https://doi.org/10.1515/aot-2014-0042
出版ステータス	Published - 2014 8 1

ASJC Scopus subject areas

@article{69657baf7e9f46219102cf8b8776d616,

title = "Optical metrology for precision engineering",

author = "Wei Gao and Bernd Bodermann",

year = "2014",

month = aug,

day = "1",

doi = "10.1515/aot-2014-0042",

language = "English",

volume = "3",

pages = "373--374",

journal = "Advanced Optical Technologies",

issn = "2192-8576",

publisher = "de Gruyter",

number = "4",

}

TY - JOUR

T1 - Optical metrology for precision engineering

AU - Gao, Wei

AU - Bodermann, Bernd

PY - 2014/8/1

Y1 - 2014/8/1

UR - http://www.scopus.com/inward/record.url?scp=84941903317&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84941903317&partnerID=8YFLogxK

U2 - 10.1515/aot-2014-0042

DO - 10.1515/aot-2014-0042

M3 - Editorial

AN - SCOPUS:84941903317

VL - 3

SP - 373

EP - 374

JO - Advanced Optical Technologies

JF - Advanced Optical Technologies

SN - 2192-8576

IS - 4

ER -