Optical constants of very thin Pt and Rh films determined from soft-X-ray reflectance and photoelectric yield measurements

Maehara Takumi Maehara, Yanagihara Mihiro Yanagihara, Yamamoto Masaki Yamamoto, Namioka Takeshi Namioka

研究成果: Article査読

抄録

Optical constants of very thin platinum and rhodium films for soft X-rays (70-900 eV) have been determined using two techniques of independent measurements of the reflectance and the total photoelectric yield for the same samples. The measured reflectances were analyzed with a plane parallel slab model with a Debye-Waller factor, with consideration given to the surface roughness. The total photoelectric yield data were examined with a model based upon Pepper's formula. The corresponding optical constants agreed well with each other, showing the degree of reliability on the optical constants in the soft X-ray region.

本文言語English
ページ(範囲)362-367
ページ数6
ジャーナルNuclear Inst. and Methods in Physics Research, B
74
3
DOI
出版ステータスPublished - 1993 5月 2
外部発表はい

ASJC Scopus subject areas

  • 核物理学および高エネルギー物理学
  • 器械工学

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