On the evaluation of electromagnetic information leakage from mobile device screens

Ville Yli-Mäyry, Daisuke Miyata, Naofumi Homma, Takafumi Aoki, Yuichi Hayashi

研究成果: Conference contribution

抄録

We present a statistical testing based methodology for evaluating electromagnetic radiation from a tested mobile device that potentially contains exploitable information for re-constructing screen images of the device. The basic idea is to employ a statistical test instead of reconstructing screen images. The validity of our methodology is demonstrated in a real-world setting by an experiment observing EM radiation from a tablet device's screen that would be usable in a TEMPEST attack.

本文言語English
ホスト出版物のタイトル2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility, EMC/APEMC 2018
出版社Institute of Electrical and Electronics Engineers Inc.
ページ1050-1052
ページ数3
ISBN(電子版)9781509059973
DOI
出版ステータスPublished - 2018 6 22
イベント60th IEEE International Symposium on Electromagnetic Compatibility and 9th IEEE Asia-Pacific Symposium on Electromagnetic Compatibility, EMC/APEMC 2018 - Suntec City, Singapore
継続期間: 2018 5 142018 5 18

出版物シリーズ

名前2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility, EMC/APEMC 2018

Other

Other60th IEEE International Symposium on Electromagnetic Compatibility and 9th IEEE Asia-Pacific Symposium on Electromagnetic Compatibility, EMC/APEMC 2018
国/地域Singapore
CitySuntec City
Period18/5/1418/5/18

ASJC Scopus subject areas

  • 航空宇宙工学
  • 電子工学および電気工学
  • 安全性、リスク、信頼性、品質管理
  • 放射線

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