On the cover. Near-field scanning optical microscopy

Hitoshi Shiku, Robert C. Dunn

研究成果: Review article査読

20 被引用数 (Scopus)

抄録

The resolution in conventional microscopy is limited by the wavelength of light. Near-field scanning optical microscopy (NSOM) is designed to avoid diffraction limits, providing resolution of nanometer-sized samples. Hitoshi Shiku and Robert C. Dunn of the University of Kansas describe the concepts behind NSOM and illustrate some of its applications.

本文言語English
ジャーナルAnalytical Chemistry
71
1
出版ステータスPublished - 1999 1 1
外部発表はい

ASJC Scopus subject areas

  • 分析化学

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