The resolution in conventional microscopy is limited by the wavelength of light. Near-field scanning optical microscopy (NSOM) is designed to avoid diffraction limits, providing resolution of nanometer-sized samples. Hitoshi Shiku and Robert C. Dunn of the University of Kansas describe the concepts behind NSOM and illustrate some of its applications.
|出版ステータス||Published - 1999 1月 1|
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