On the choice of cascade de-embedding methods for on-wafer S-parameter measurement

S. Amakawa, K. Takano, K. Katayama, M. Motoyoshi, T. Yoshida, M. Fujishima

研究成果: Conference contribution

7 被引用数 (Scopus)

抄録

Performance of thru-only cascade de-embedding methods and their variants that use a Π- or a T-equivalent to represent and bisect a symmetric THRU is assessed. The results from the Π- and T-based methods are reasonable at low frequencies. However they are shown to deviate noticeably from the correct results as the frequency gets high or, equivalently, when the length of the THRU approaches an effective wavelength λ. A better alternative at high frequencies is TSD (thru-short-delay), which, when THRU is symmetric, requires only THRU and LINE. TSD gives correct results except in the periodically appearing 'dead zones', provided that the characteristic impedance, Zχ, of the transmission line (TL) in the LINE is known. A Π-based method could be used to extract Zχ at low frequencies, from which Zχ can be extrapolated to higher frequencies.

本文言語English
ホスト出版物のタイトルProceedings of the 2012 IEEE International Symposium on Radio-Frequency Integration Technology, RFIT 2012
ページ134-136
ページ数3
DOI
出版ステータスPublished - 2012
イベント2012 IEEE International Symposium on Radio-Frequency Integration Technology, RFIT 2012 - Singapore, Singapore
継続期間: 2012 11月 212012 11月 23

出版物シリーズ

名前Proceedings of the 2012 IEEE International Symposium on Radio-Frequency Integration Technology, RFIT 2012

Conference

Conference2012 IEEE International Symposium on Radio-Frequency Integration Technology, RFIT 2012
国/地域Singapore
CitySingapore
Period12/11/2112/11/23

ASJC Scopus subject areas

  • コンピュータ ネットワークおよび通信

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