On-chip and on-board RF noise coupling and impacts on LTE wireless communication performance (Invited)

Makoto Nagata, Noriyuki Miura, Sho Muroga, Satoshi Tanaka, Masahiro Yamaguchi

研究成果: Conference contribution

抄録

In-band interferers due to noise coupling from baseband digital circuits significantly impact on the wireless communication performance, in the case of single-chip system-level integration. The on-chip and off-chip (on-board) noise coupling are measured for visualizing the noise couplings. In addition, the hardware-in-the-loop simulation (HILS) estimates their impacts on the performance metrics like throughputs, under the interactions of interferers with the operation of LTE-compliant RF receiver circuits in a 65 nm CMOS technology.

本文言語English
ホスト出版物のタイトル2015 IEEE International Symposium on Radio-Frequency Integration Technology, RFIT 2015 - Proceedings
出版社Institute of Electrical and Electronics Engineers Inc.
ページ7-9
ページ数3
ISBN(電子版)9781467377942
DOI
出版ステータスPublished - 2016 1 8
イベントIEEE International Symposium on Radio-Frequency Integration Technology, RFIT 2015 - Sendai, Japan
継続期間: 2015 8 262015 8 28

出版物シリーズ

名前2015 IEEE International Symposium on Radio-Frequency Integration Technology, RFIT 2015 - Proceedings

Other

OtherIEEE International Symposium on Radio-Frequency Integration Technology, RFIT 2015
CountryJapan
CitySendai
Period15/8/2615/8/28

ASJC Scopus subject areas

  • Computer Networks and Communications
  • Electrical and Electronic Engineering

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