Numerical evaluation of the depth of branched-off cracks using eddy current testing signals

Weiying Cheng, Shigeru Kanemoto, Ichiro Komura

研究成果: Article査読

5 被引用数 (Scopus)

抄録

Numerical simulation shows that eddy current testing (ECT) signal of a branched-off crack is much larger than that of a same deep, single crack. To avoid the overestimation of the depth of a branched-off crack, a depth sizing index, which is designed to have maximum sensitivity to crack depth, is constructed based on an optimization approach, and the depths of branched-off cracks are estimated using this index. This depth sizing approach is numerically and experimentally validated.

本文言語English
論文番号4526823
ページ(範囲)1030-1033
ページ数4
ジャーナルIEEE Transactions on Magnetics
44
6
DOI
出版ステータスPublished - 2008 6
外部発表はい

ASJC Scopus subject areas

  • 電子材料、光学材料、および磁性材料
  • 電子工学および電気工学

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