TY - JOUR
T1 - Nonlinear detection of ultrasonic vibrations in an atomic force microscope
AU - Kolosov, Oleg
AU - Yamanaka, Kazushi
PY - 1993/8
Y1 - 1993/8
N2 - A new method is proposed to detect ultrasonic vibration of the samples in the Atomic Force Microscope (AFM) using nonlinearity in the tip-sample interaction force curve F(z). Small amplitude ultrasonic vibration less than 0.2 nm is detected as an average displacement of a cantilever. This Ultrasonic Force Mode (UFM) of operation is advantageous in detecting ultrasonic vibration with frequencies up to the GHz range, using an AFM cantilever with a resonant frequency below 100 kHz. It was found that a strong repulsive force is acting after an ultrasonic amplitude threshold of the is crossed, with the amplitude of this threshold depending upon the average force applied to the tip.
AB - A new method is proposed to detect ultrasonic vibration of the samples in the Atomic Force Microscope (AFM) using nonlinearity in the tip-sample interaction force curve F(z). Small amplitude ultrasonic vibration less than 0.2 nm is detected as an average displacement of a cantilever. This Ultrasonic Force Mode (UFM) of operation is advantageous in detecting ultrasonic vibration with frequencies up to the GHz range, using an AFM cantilever with a resonant frequency below 100 kHz. It was found that a strong repulsive force is acting after an ultrasonic amplitude threshold of the is crossed, with the amplitude of this threshold depending upon the average force applied to the tip.
KW - Atomic force microscope
KW - Nonlinear atomic force microscope
KW - Nonlinear vibrations
KW - UFM
KW - Ultrasonic force mode
KW - Ultrasonics
KW - Viscoelastic properties evaluation
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U2 - 10.1143/JJAP.32.L1095
DO - 10.1143/JJAP.32.L1095
M3 - Article
AN - SCOPUS:0027643009
VL - 32
SP - L1095-L1098
JO - Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes
JF - Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes
SN - 0021-4922
IS - 8 A
ER -