Non-invasive EMI-based fault injection attack against cryptographic modules

Yu-Ichi Hayashi, Naofumi Homma, Takeshi Sugawara, Takaaki Mizuki, Takafumi Aoki, Hideaki Sone

研究成果: Conference contribution

25 被引用数 (Scopus)

抄録

In this paper, we introduce a new type of intentional electromagnetic interference (IEMI) which causes information leakage in electrical devices without disrupting their operation or damaging their physical structure. Such IEMI could pose a severe threat to a large number of electrical devices with cryptographic modules since it can be used for performing fault injection attacks, which in turn allows for obtaining faulty outputs (i.e., ciphertexts) from cryptographic modules and exploiting them to reveal information about secret keys. Such faulty outputs are usually generated by inducing faults into target modules through modification or invasion of the modules themselves. In contrast, IEMI-based fault injection can be performed on the target modules from a distance by using an off-the-shelf injection probe without leaving any hard evidence of the attack. We demonstrate fault injection attacks based on the above IEMI through experiments using an Advanced Encryption Standard (AES) module implemented on a standard evaluation board (SASEBO). The experimental results indicate that generating effective faults is feasible and, therefore, such IEMI presents a tangible threat to many existing electrical devices and systems that use cryptographic modules for secure communication and transactions.

本文言語English
ホスト出版物のタイトルEMC 2011 - Proceedings
ホスト出版物のサブタイトル2011 IEEE International Symposium on Electromagnetic Compatibility
ページ763-767
ページ数5
DOI
出版ステータスPublished - 2011 10月 24
イベント2011 IEEE International Symposium on Electromagnetic Compatibility, EMC 2011 - Long Beach, CA, United States
継続期間: 2011 8月 142011 8月 19

出版物シリーズ

名前IEEE International Symposium on Electromagnetic Compatibility
ISSN(印刷版)1077-4076

Other

Other2011 IEEE International Symposium on Electromagnetic Compatibility, EMC 2011
国/地域United States
CityLong Beach, CA
Period11/8/1411/8/19

ASJC Scopus subject areas

  • 凝縮系物理学
  • 電子工学および電気工学

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