New ADXD/EDXD spectrometer for determining the structure of melts at high temperature

Kazumasa Sugiyama, Takeshi Shinkai, Yoshio Waseda

研究成果: Article査読

6 被引用数 (Scopus)

抄録

A new spectrometer for angular dispersive X-ray diffraction (ADXD) and energy dispersive X-ray diffraction (EDXD) facility has been built using a vertical type θ-θgoniometer, which makes possible to measure the diffraction profiles of high temperature melts over 200 mn-1. The fundamentals of this facility were tested by obtaining the interference function of molten NaAlSi3O8 at 1460 K. The feasibility of the EDXD analysis for high temperature melts was also confirmed by obtaining the well resolved RDF of molten LiNbO3 at 1550 K.

本文言語English
ページ(範囲)231-237
ページ数7
ジャーナルScience Reports of the Rerearch Institutes Tohoku University Series A-Physics
42
1
出版ステータスPublished - 1996 3月 1

ASJC Scopus subject areas

  • 凝縮系物理学
  • 金属および合金

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