New ADXD/EDXD spectrometer for determining the structure of melts at high temperature

Kazumasa Sugiyama; Takeshi Shinkai; Yoshio Waseda

New ADXD/EDXD spectrometer for determining the structure of melts at high temperature

Kazumasa Sugiyama, Takeshi Shinkai, Yoshio Waseda

金属材料研究所・物質創製研究部

研究成果: Article › 査読

6 被引用数 (Scopus)

抄録

A new spectrometer for angular dispersive X-ray diffraction (ADXD) and energy dispersive X-ray diffraction (EDXD) facility has been built using a vertical type θ-θgoniometer, which makes possible to measure the diffraction profiles of high temperature melts over 200 mn^-1. The fundamentals of this facility were tested by obtaining the interference function of molten NaAlSi₃O₈ at 1460 K. The feasibility of the EDXD analysis for high temperature melts was also confirmed by obtaining the well resolved RDF of molten LiNbO₃ at 1550 K.

本文言語	English
ページ（範囲）	231-237
ページ数	7
ジャーナル	Science Reports of the Rerearch Institutes Tohoku University Series A-Physics
巻	42
号	1
出版ステータス	Published - 1996 3月 1

ASJC Scopus subject areas

凝縮系物理学
金属および合金

他のファイルとリンク

引用スタイル

@article{10cc535b88ca4c50a693187342ed00d4,

title = "New ADXD/EDXD spectrometer for determining the structure of melts at high temperature",

abstract = "A new spectrometer for angular dispersive X-ray diffraction (ADXD) and energy dispersive X-ray diffraction (EDXD) facility has been built using a vertical type θ-θgoniometer, which makes possible to measure the diffraction profiles of high temperature melts over 200 mn-1. The fundamentals of this facility were tested by obtaining the interference function of molten NaAlSi3O8 at 1460 K. The feasibility of the EDXD analysis for high temperature melts was also confirmed by obtaining the well resolved RDF of molten LiNbO3 at 1550 K.",

keywords = "ADXD, EDXD, High temperature, Melt structure, RDF, X-ray diffraction",

author = "Kazumasa Sugiyama and Takeshi Shinkai and Yoshio Waseda",

year = "1996",

month = mar,

day = "1",

language = "English",

volume = "42",

pages = "231--237",

journal = "Science Reports of the Rerearch Institutes Tohoku University Series A-Physics",

issn = "0040-8808",

publisher = "Tohoku University",

number = "1",

}

TY - JOUR

T1 - New ADXD/EDXD spectrometer for determining the structure of melts at high temperature

AU - Sugiyama, Kazumasa

AU - Shinkai, Takeshi

AU - Waseda, Yoshio

PY - 1996/3/1

Y1 - 1996/3/1

N2 - A new spectrometer for angular dispersive X-ray diffraction (ADXD) and energy dispersive X-ray diffraction (EDXD) facility has been built using a vertical type θ-θgoniometer, which makes possible to measure the diffraction profiles of high temperature melts over 200 mn-1. The fundamentals of this facility were tested by obtaining the interference function of molten NaAlSi3O8 at 1460 K. The feasibility of the EDXD analysis for high temperature melts was also confirmed by obtaining the well resolved RDF of molten LiNbO3 at 1550 K.

AB - A new spectrometer for angular dispersive X-ray diffraction (ADXD) and energy dispersive X-ray diffraction (EDXD) facility has been built using a vertical type θ-θgoniometer, which makes possible to measure the diffraction profiles of high temperature melts over 200 mn-1. The fundamentals of this facility were tested by obtaining the interference function of molten NaAlSi3O8 at 1460 K. The feasibility of the EDXD analysis for high temperature melts was also confirmed by obtaining the well resolved RDF of molten LiNbO3 at 1550 K.

KW - ADXD

KW - EDXD

KW - High temperature

KW - Melt structure

KW - RDF

KW - X-ray diffraction

UR - http://www.scopus.com/inward/record.url?scp=33748872868&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=33748872868&partnerID=8YFLogxK

M3 - Article

AN - SCOPUS:33748872868

VL - 42

SP - 231

EP - 237

JO - Science Reports of the Rerearch Institutes Tohoku University Series A-Physics

JF - Science Reports of the Rerearch Institutes Tohoku University Series A-Physics

SN - 0040-8808

IS - 1

ER -

New ADXD/EDXD spectrometer for determining the structure of melts at high temperature

抄録

ASJC Scopus subject areas

他のファイルとリンク

フィンガープリント

引用スタイル