Near-field microwave imaging of inhomogeneous KxFeySe2: Separation of topographic and electric features

Hideyuki Takahashi, Yoshinori Imai, Atsutaka Maeda

研究成果: Article査読

3 被引用数 (Scopus)

抄録

It is important for modern scanning microwave microscopes (SMMs) to overcome the effect of the surface roughness. Here, we report microwave conductivity imaging of the phase-separated iron chalcogenide KxFeySe2 (x=0.8, y=1.6-2), in which electric conductivity-induced contrast is distinguished from topography-induced contrast using a combination of a scanning tunneling microscope and a SMM. We observed the characteristic modulation of the local electric property that originates from the mesoscopic phase separation of the metallic and semiconducting phases in two different scanning modes: constant current mode and constant Q (CQ) mode. In particular, CQ scanning is useful because we obtain a qualitative image in which the topographic contrast is largely eliminated without degradation of the spatial resolution.

本文言語English
論文番号233106
ジャーナルApplied Physics Letters
106
23
DOI
出版ステータスPublished - 2015 6 8
外部発表はい

ASJC Scopus subject areas

  • 物理学および天文学(その他)

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「Near-field microwave imaging of inhomogeneous K<sub>x</sub>Fe<sub>y</sub>Se<sub>2</sub>: Separation of topographic and electric features」の研究トピックを掘り下げます。これらがまとまってユニークなフィンガープリントを構成します。

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