TY - CONF
T1 - Nanorheology on polymer surface [III]
AU - Nagai, Sae
AU - Nukaga, Hideyuki
AU - Watabe, Hiroyuki
AU - Fujinami, So
AU - Nakajima, Ken
AU - Nishi, Toshio
PY - 2006/10/19
Y1 - 2006/10/19
N2 - Our purpose is to estimate the viscoelastic properties of polymeric surfaces in nanometer scale with atomic force microscopy (AFM). Particularly, we direct an attention to force-distance curve (force curve), whose profile gives qualitative information about the hardness of sample. But in this time, to investigate quantitative values of mechanical properties, we use the method analyzing force curves based on the JKR theory. Furthermore, we discuss the dependence of elastic modulus or adhesive energy of IIR on temperature, scan rate and indentation depth.
AB - Our purpose is to estimate the viscoelastic properties of polymeric surfaces in nanometer scale with atomic force microscopy (AFM). Particularly, we direct an attention to force-distance curve (force curve), whose profile gives qualitative information about the hardness of sample. But in this time, to investigate quantitative values of mechanical properties, we use the method analyzing force curves based on the JKR theory. Furthermore, we discuss the dependence of elastic modulus or adhesive energy of IIR on temperature, scan rate and indentation depth.
KW - Atomic Force Microscopy
KW - Force-curve
KW - JKR theory
KW - Nanorheology
UR - http://www.scopus.com/inward/record.url?scp=33749826623&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=33749826623&partnerID=8YFLogxK
M3 - Paper
AN - SCOPUS:33749826623
T2 - 55th SPSJ Annual Meeting
Y2 - 24 May 2006 through 26 May 2006
ER -