Nanorheology mapping by atomic force microscopy

Ken Nakajima, So Fujinami, Hideyuki Nukaga, Hiroyuki Watabe, Hiroki Kitano, Naoto Ono, Katsuyoshi Endoh, Mie Kaneko, Toshio Nishi

研究成果: Article査読

11 被引用数 (Scopus)

抄録

A novel idea to extend the capability of an atomic force microscopy (AFM) to soft materials is proposed for the purpose of obtaining sample deformation and modulus distribution images as well as topographic image (nanorheology mapping). An immiscible polymer blend system, elongated natural rubber, and hair cross section are used as model samples. Further extension of this idea leads to tapping-mode force-distance curve analysis aiming at the acquisition of sample deformation information. A force modulation technique is also reviewed in terms of the future development of three-dimensional mechanical properties imaging by AFM, together with the above two techniques.

本文言語English
ページ(範囲)476-487
ページ数12
ジャーナルKOBUNSHI RONBUNSHU
62
10
DOI
出版ステータスPublished - 2005 10月
外部発表はい

ASJC Scopus subject areas

  • 化学工学(その他)
  • 材料科学(その他)
  • 環境科学(全般)
  • ポリマーおよびプラスチック

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