Nanometer-scale pit formation by scanning tunneling microscopy on graphite surface and tip current measurements

Tsukasa Abe, Kazuhiro Hane, Shigeru Okuma

研究成果: Article査読

8 被引用数 (Scopus)

抄録

Nanometer-scale pit formation by the application of pulse voltage was performed on highly oriented graphite in air with the simultaneous measurement of tip current. The tip current was measured to be on the order of microamperes. Regardless of the high current, the pit was not formed at pulse voltages less than a critical value. It is confirmed by the quantitative measurement of the current that high current is less important for pit formation under experimental conditions. The measurement of the critical voltage as a function of the tunnel resistance suggested the significance of high electric field for pit formation.

本文言語English
ページ(範囲)1228-1230
ページ数3
ジャーナルJournal of Applied Physics
75
2
DOI
出版ステータスPublished - 1994 12 1
外部発表はい

ASJC Scopus subject areas

  • 物理学および天文学(全般)

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