Nanometer-scale characterization of surface materials by STM light emission spectroscopy

Y. Uehara, K. Ito, S. Ushioda

研究成果: Article査読

15 被引用数 (Scopus)

抄録

Three typical applications of the STM light emission spectroscopy in nanometer-scale characterization of surface materials are reviewed. When electrons (holes) are injected from the tip of a STM to a sample surface, visible light is emitted. Since the beam diameter of electrons from the STM tip is narrower than ∼ 1 nm and moreover the beam energy is very low, one can obtain the light emission spectra of individual nanometer-scale structures without modifying them. By correlating the spectra with the size and shape of the structure, materials information about nanometer-scale individual structures can be obtained.

本文言語English
ページ(範囲)247-254
ページ数8
ジャーナルApplied Surface Science
107
DOI
出版ステータスPublished - 1996 11

ASJC Scopus subject areas

  • 化学 (全般)
  • 凝縮系物理学
  • 物理学および天文学(全般)
  • 表面および界面
  • 表面、皮膜および薄膜

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