Nano domain engineering using scanning nonlinear dielectric microscopy

Yasuo Cho, Kaori Matsuura, Satoshi Kazuta, Hiroyuki Odagawa, Kazuya Terabe, Kenji Kitamura

研究成果: Conference contribution

1 引用 (Scopus)

抜粋

Scanning Nonlinear Dielectric Microscopy (SNDM) is the first successful purely electrical method for observing ferroelectric domains. Now its resolution has become to the sub-nanometer order. In this paper fundamental study on applying SNDM system to the ferroelectric reading and writing system is performed. At first, to check the performance of the SNDM system as a ferroelectric recording system, we conduct a fundamental study on the writing of domain inversion dot in PZT thin film and succeed to have a very small domain dots with the size of 25nm. Next, we form small inverted domain dots in stoichiometric LiTaO3 single crystal for the purpose of a basic investigation of domain dynamics in a very small area. The relationship between the voltage for domain reversal and the inverted area and the relationship between the inverted domain area and the voltage application time are obtained.

元の言語English
ホスト出版物のタイトルProceedings of the 2001 1st IEEE Conference on Nanotechnology, IEEE-NANO 2001
出版者IEEE Computer Society
ページ352-357
ページ数6
ISBN(電子版)0780372158
DOI
出版物ステータスPublished - 2001 1 1
イベント1st IEEE Conference on Nanotechnology, IEEE-NANO 2001 - Maui, United States
継続期間: 2001 10 282001 10 30

出版物シリーズ

名前Proceedings of the IEEE Conference on Nanotechnology
2001-January
ISSN(印刷物)1944-9399
ISSN(電子版)1944-9380

Other

Other1st IEEE Conference on Nanotechnology, IEEE-NANO 2001
United States
Maui
期間01/10/2801/10/30

ASJC Scopus subject areas

  • Bioengineering
  • Electrical and Electronic Engineering
  • Materials Chemistry
  • Condensed Matter Physics

フィンガープリント Nano domain engineering using scanning nonlinear dielectric microscopy' の研究トピックを掘り下げます。これらはともに一意のフィンガープリントを構成します。

  • これを引用

    Cho, Y., Matsuura, K., Kazuta, S., Odagawa, H., Terabe, K., & Kitamura, K. (2001). Nano domain engineering using scanning nonlinear dielectric microscopy. : Proceedings of the 2001 1st IEEE Conference on Nanotechnology, IEEE-NANO 2001 (pp. 352-357). [966447] (Proceedings of the IEEE Conference on Nanotechnology; 巻数 2001-January). IEEE Computer Society. https://doi.org/10.1109/NANO.2001.966447