Multiple scattering study of synchrotron radiation photoelectron diffraction from Si(001)2×2-In surface

X. Chen, H. W. Yeom, T. Abukawa, Y. Takakuwa, T. Shimatani, Y. Mori, A. Kakizaki, S. Kono

研究成果: Article査読

7 被引用数 (Scopus)

抄録

Synchrotron radiation photoelectron diffraction (FED) from the Si(001)2×2-In surface was measured for the well resolved In 4d spin-orbit doublet (4d3/2 and 4d5/2) at photon energy of 100 eV. It is found that the two diffraction patterns originating from different core-level states are notably different from each other. A multiple scattering cluster method was applied to analyze both PED's. The optimized structures from the two patterns take essentially a similar parallel In-dimer model, but the radial matrix elments and phase shifts of the photoelectron continuums are different for the two components. We attribute this unexpected result to a spin-orbit coupling effect near the Cooper minima.

本文言語English
ページ(範囲)147-150
ページ数4
ジャーナルJournal of Electron Spectroscopy and Related Phenomena
80
DOI
出版ステータスPublished - 1996 5

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Radiation
  • Atomic and Molecular Physics, and Optics
  • Condensed Matter Physics
  • Spectroscopy
  • Physical and Theoretical Chemistry

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